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Shanghai Synchrotron Radiation Facility (SSRF)

  1. Home>Facilities>Material>Shanghai Synchrotron Radiation Facility (SSRF)>Equipment
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Equipment
  • BSL-2 Macromolecular Crystallography Beamline

    BSL-2 Macromolecular Crystallography Beamline

  • Time-resolved USAXS beamline

    Time-resolved USAXS beamline

  • Spatial and Spin resolution ARPES and Magnetism

    Spatial and Spin resolution ARPES and Magnetism

  • BL05U&06B-D-line EDXAS& IR endstation

    BL05U&06B-D-line EDXAS& IR endstation

  • Infrared Spectromicroscopy Station

    Infrared Spectromicroscopy Station

  • BL05U-D-line EDXAS endstation

    BL05U-D-line EDXAS endstation

  • Surface diffraction beamline

    Surface diffraction beamline

  • BL17U1 Macromolecular Crystallography Beamline

    BL17U1 Macromolecular Crystallography Beamline

  • Hard X-ray Spectroscopy Beamline

    Hard X-ray Spectroscopy Beamline

  • BL16B1 Small Angle X-ray Scattering (SAXS) Beamline

    BL16B1 Small Angle X-ray Scattering (SAXS) Beamline

  • BL15U1 Hard X-ray Micro-Focusing Beamline

    BL15U1 Hard X-ray Micro-Focusing Beamline

  • BL14W1 X-ray Absorption Fine Structure Spectroscopy (XAFS) Beamline

    BL14W1 X-ray Absorption Fine Structure Spectroscopy (XAFS) Beamline

  • BL14B1 X-ray Diffraction Beamline

    BL14B1 X-ray Diffraction Beamline

  • BL13W1 X-ray Imaging and Biomedical Applications Beamline

    BL13W1 X-ray Imaging and Biomedical Applications Beamline

  • BL09U X-ray Photoemission Spectroscopy and Microscopy Beamline

    BL09U X-ray Photoemission Spectroscopy and Microscopy Beamline

  • BL08U1-B Soft X-ray Interference Lithography (XIL) Beamline

    BL08U1-B Soft X-ray Interference Lithography (XIL) Beamline

  • BL08U1-A Soft X-ray Spectromicroscopy Beamline

    BL08U1-A Soft X-ray Spectromicroscopy Beamline

  • High-resolution angle resolved photoemission spectroscopy

    High-resolution angle resolved photoemission spectroscopy

  • Photon in Photon out End-station

    Photon in Photon out End-station

  • Ambient pressure X-ray Photoneltron spectrascopy

    Ambient pressure X-ray Photoneltron spectrascopy

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