This system consists of a superconducting magnet with a 52.8 mm low-temperature bore and a microscopy system (SMA) integrating a Scanning Tunneling Microscope (STM), a Magnetic Force Microscope (MFM), and an Atomic Force Microscope (AFM).

Technical Specifications:  The STM (atomic resolution), MFM( 10 nm) and AFM  (atomic resolution), are integrated into a single single probe unit, which is housed within the low-temperature bore of the 18/20 T high-field magnet. This configuration enables 0 to 18/20 T variable magnetic field and 7 to 300 K variable temperature measurements. The integration not only enhances instrument usage efficiency but also allows multi-dimensional sample characterization by leveraging the unique imaging capabilities of the three scanning probe microscopes.

Applications: The system is suitable for variable-temperature and variable-magnetic-field characterization of materials, such as magnetic materials, superconductors, topological materials, low-dimensional materials, single-crystal materials, and nanostructures with optimal dispersion density.