X-ray spectromicroscopy is a technique for high brilliant tunable synchrotron radiation, which could combine the two important functions such as the sub-50 nm resolving ability in space determined by the zone plate, and the chemical distinguishing ability determined by the beamline monochromator via NEXAFS spectroscopy. The photon energy of BL08U1-A was range from 250 to 2000 eV, covering the K-edge of C, N, O, F, Na, Mg, Al, Si, and L edges of Cl, K, Ca, Fe, Cu, Zn. The study of these elements is very important in biological science, environmental science, polymer, and material science. In addition, the light source was finally decided by an elliptical polarized undulator, which would add more opportunities to study x-ray-polarization-dependent materials.