The CSNS small-angle scatterometer (SANS) is the first general-purpose time-of-flight small-angle scatterometer based on a pulsed neutron source (25Hz) in China. It can obtain chemical and magnetic inhomogeneous structure information of 1-100 nanometers in samples. The CSNS small-angle scatterometer adopts a short straight beam line design with a total length of 18 meters. The distance between the sample and the detector can be adjusted within 2 to 5 meters, and it has a wide range of Q values. At present, in-situ observations of the dynamic evolution process of nanostructures can be achieved under high temperature, low temperature and magnetic field loading conditions.